An Aging-resistant Ro-puf For Reliable Key Generation

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An Aging-Resistant RO-PUF for Reliable Key Generation Article in IEEE Transactions on Emerging Topics in Computing 99(3) September 2015 with 89 Reads How we measure 'reads'. Simulation results demonstrate that our aging resistant RO-PUF (called ARO-PUF) can produce unique, random, and more reliable keys. Only 7.7% bits get flipped on average over 10 years operation period for an ARO-PUF due to aging where the value is 32% for a conventional RO-PUF. Tehranipoor, 'Systematic Correlation and Cell Neighborhood Analysis of SRAM-PUF for Robust and Unique Key Generation,' in Journal of Hardware and Systems Security (HaSS), 2017 (in press). Simulation results demonstrate that our aging-resistant RO-PUF (ARO-PUF) can produce unique, random, and more reliable keys. Online key generator adobe cs6. On an average, only 3.8% bits of an ARO-PUF flip over a ten-year operational period because of aging, compared with a 12.8% bit flip for a conventional RO-PUF.


B2.M. T. Rahman, D. Forte, M. Tehranipoor, 'Protection of Assets from Scan Chain Vulnerabilities through Obfuscation,' in Hardware Protection through Obfuscation by Domenic Forte, Swarup Bhunia, and Mark M. Tehranipoor, Springer, 2017.
B1.M. T. Rahman, 'Prevention of Unlicensed and Rejected ICs from Untrusted Foundry and Assembly' in Counterfeit Integrated Circuits: Detection and Avoidance, Springer, 2015.
Journals:
J4.Z. Guo, X. Xu, M. T. Rahman, M. Tehranipoor, D. Forte, 'SCARe: An SRAM-based Countermeasure Against IC Recycling,' IEEE Transactions on Very Large Scale Integration Systems, 2017 (in press).
J3. M.T. Rahman, A. Hosey, Z. Guo, D. Forte, M. Tehranipoor, 'Systematic Correlation and Cell Neighborhood Analysis of SRAM-PUF for Robust and Unique Key Generation,' in Journal of Hardware and Systems Security (HaSS), 2017 (in press).
J2. M.T. Rahman, F. Rahman, D. Forte, M. Tehranipoor, 'An Aging-Resistant RO-PUF for Reliable Key Generation,' IEEE Transactions on Emerging Topics in Computing (TETC), 2015.
J1.A. Mazady, M.T. Rahman, D. Forte, M. Anwar, 'Memristor Nano-PUF A Security Primitive: Theory and Experiment,' in IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS).


C17. M. T. Rahman, D. Forte, and M. Tehranipoor, 'SRAM Inspired Design and Optimization for Developing Robust Security Primitives,' in SRC TECHCON, September 2016. [Awarded Best in Session]
C16.Z. Guo, M. T. Rahman, M. Tehranipoor, D. Forte, 'A Zero-cost Approach to Detect Recycled SoCs Using Embedded SRAM', Hardware-Oriented Security and Trust (HOST) 2016, May 2016.
C15. M. T. Rahman, D. Forte, X. Wang, M. Tehranipoor, 'Enhancing Noise Sensitivity of Embedded SRAMs for Robust True Random Number Generation in SoCs,' IEEE Asian Hardware-Oriented Security and Trust (AsianHOST), Dec. 2016.

An Aging-resistant Ro-puf For Reliable Key Generation Computer

C14. M. T. Rahman, D. Forte, F. Rahman, M. Tehranipoor, 'A Pair Selection Algorithm for Robust RO-PUF Against Environmental Variations and Aging,' to appear IEEE International Conference on Computer Design (ICCD), Oct. 2015.
C13. M. T. Rahman, D. Forte, and M. Tehranipoor, 'Robust SRAM-PUF: Cell Stability Analysis and Novel Bit-Selection Algorithm,'TECHCON, 2015.
C12. M. T. Rahman, A. Hosey, K. Xiao, D. Forte, and M. Tehranipoor, 'Cell Stability Analysis and Novel Bit-Selection Algorithm for Robust SRAM-PUF,'Connecticut Microelectronic Symposium (CMOC), 2015.
C11. N. Karimianbahnemiri, F. Tehranipoor, M.T. Rahman, D. Forte, 'Genetic Algorithm for Hardware Trojan Detection with Ring Oscillator Network (RON),' IEEE International Conference on Technologies for Homeland Security (HST), April 2015.

An Aging-resistant Ro-puf For Reliable Key Generation Free

C10. M.T. Rahman, A. Hosey, F. Rahman, D. Forte, M. Tehranipoor, 'RePa: A Pair Selection Algorithm for Reliable Keys from RO-based PUF' to appear GOMACTech, March 2015.
C9. A. Hosey, M.T. Rahman, K. Xiao, D. Forte, M. Tehranipoor, 'Advanced Analysis of Cell Stability for Reliable SRAM PUF,' to appear IEEE Asian Test Symposium (ATS), November 2014.
C8. M.T. Rahman, D. Forte, Q. Shi, G. Contreras, M. Tehranipoor, 'CSST: Preventing Distribution of Unlicensed and Rejected ICs by Untrusted Foundry and Assembly,' IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Oct. 2014.
C7. M.T. Rahman, K. Xiao, D. Forte, X. Zhang, Z. Shi, M. Tehranipoor, 'TI-TRNG: Technology Independent True Random Number Generator,' Design Automation Conference (DAC), June 2014 (Richard Newton Young Student Fellow).
C6. M.T. Rahman, D. Forte, Q. Shi, G. Contreras, M. Tehranipoor, 'CSST: An Efficient Secure Split-Test for Preventing IC Piracy,' IEEE North Atlantic Test Workshop (NATW), May 2014.
For

An Aging-resistant Ro-puf For Reliable Key Generation 7

C5. K. Xiao, M.T. Rahman, D. Forte, M. Su, Y. Huang, M.Tehranipoor, 'Bit Selection Algorithm Suitable for High-Volume Production of SRAM-PUF,' in Hardware-Oriented Security and Trust (HOST), May 2014.
C4. M.T. Rahman, D. Forte, J. Fahrny, M. Tehranipoor, 'ARO-PUF: An Aging-Resistant Ring Oscillator PUF Design,' Design, Automation, & Test in Europe (DATE), March 2014.
C3.Kan Xiao, Md. Tauhidur Rahman, Domenic Forte, and M. Tehranipoor, 'Low-cost Analysis of SRAM PUFs for Identification of Mass-Produced Electronic Devices' -GOMACTech-2014.

An Aging-resistant Ro-puf For Reliable Key Generation 2

C2.G. Contreras, Md. Tauhidur Rahman, and M. Tehranipoor, 'Secure Split-Test for Preventing IC Piracy by Untrusted Foundry and Assembly,'Int. Symposium on Defect and Fault Tolerance in VLSI Systems (DFT),2-4 October, 2013, NY.
C1. MM Hasan, MT Rahman, MN Hasan, A Rashid, and AR Patwary , 'A Novel Match-line Charging Control Scheme with a New Sense Amplifier for High-Speed and Low-Power Content-Addressable Memory,' inSolid State and Device Materials, Japan-2008.

Patents:
P1: M. Tehranipoor, M. Tauhidur Rahman, AND D. f, 'Prevention of Unlicensed and Rejected ICs from Untrusted Foundry and Assembly' UNTED STATES PATENT.(PENDING)



1. 'Aging-Resistant Ring Oscillator PUF Design' ARO/CHASE SPECIAL WORKSHOP ON COUNTERFEIT ELECTRONICS, UNIVERSITY OF CONNECTICUT, Jan 2013.